JOURNAL OF TEXTILE RESEARCH ›› 2005, Vol. 26 ›› Issue (2): 121-123.

• 生产技术 • Previous Articles     Next Articles

Fabric blemish detection based on attributed relational histogram

Fabric blemish detection based on attributed relational histogram   

  1. Xi'an University of Engineering Science & Technology;Xi'an;Shanxi 710048;China
  • Received:1900-01-01 Revised:1900-01-01 Online:2005-04-15 Published:2005-04-15

Abstract: Based on linear feature texture of fabric,achieved statistic histogram can abstract fabric characteristics perfectly.These feature waves show reliable and stable during numerous tests.With comparing wave features,abrupt or abnormal changes can be located precisely and fabric defects can be picked out correctly.To simplify identification,threshold filter should be introducd to overpass general wave and record abnormal status.Discrimination of various and complex defects can form a simple by filtering general unique texture.

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